Additively manufactured programmable resistive jumpers

ABSTRACT

A first conductive routing structure is electrically connected to a first electronic component. A second conductive routing structure is electrically connected to a second electronic component. An additive deposition process deposits a material over a surface of a processed wafer to form a conductive or resistive structure, which extends from a portion of the first conductive routing structure to a portion of the second conductive routing structure, to configure a circuit including the first and second electronic components.

BACKGROUND

Analog and digital circuits can be adjusted during manufacturing to setcircuit performance parameters and/or to change circuit configurations.Fuses, electrically erasable programmable read-only memory (EEPROM) andone-time programmable (OTP) memories can be used for trimming and/orprogrammed different product options during manufacturing ofmicroelectronic devices. However, those memory elements and/or fusesoften require extra masking steps and more die area, cost andcomplexity, which limit product flexibility and reliability, and/orwhich require precision special multiple pass test and programmingprocedures to ensure reliability.

SUMMARY

A first conductive routing structure is electrically connected to afirst electronic component. A second conductive routing structure iselectrically connected to a second electronic component. An additivedeposition process deposits a material over a surface of a processedwafer to form a conductive or resistive structure, which extends from anexposed portion of the first conductive routing structure to an exposedportion of the second conductive routing structure, to configure acircuit including the first and second electronic components.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flow diagram of a method of manufacturing a microelectronicdevice.

FIG. 2 is a partial side elevation view of a processed wafer withdeposited conductive material to connect metallization structurefeatures to configure circuitry of the wafer.

FIG. 3 is a partial top plan view of the wafer of FIG. 2 withschematically illustrated circuitry.

FIG. 4 is a partial side elevation view of a processed wafer withdeposited resistive material to provide a resistor between metallizationstructure features to configure circuitry of the wafer.

FIG. 5 is a partial side elevation view of a processed wafer withdeposited semiconductor material to connect metallization structurefeatures to configure circuitry of the wafer.

FIG. 6 is a partial top plan view showing several die areas of aprocessed wafer before additive deposition.

FIG. 7 is a partial top plan view showing additively depositedconductive, resistive and semiconductor structures formed betweenmetallization structure features to configure circuitry of the wafer ofFIG. 6.

FIG. 8 is a partial top plan view showing a singulated die of the waferof FIGS. 6 and 7.

DETAILED DESCRIPTION

In the drawings, like reference numerals refer to like elementsthroughout, and the various features are not necessarily drawn to scale.Also, in this description, the term “couple” or “couples” is includesindirect or direct electrical or mechanical connection or combinationsthereof. For example, if a first device couples to or is coupled with asecond device, that connection may be through a direct electricalconnection, or through an indirect electrical connection via one or moreintervening devices and connections.

FIG. 1 shows a method 100 of manufacturing and configuring amicroelectronic device, such as a microelectronic device having anintegrated circuit (IC). Unlike fuses, EEPROMs or OTP memories, themethod 100 uses printing or other additive deposition processing to formconductive or resistive material structures over a first surface (e.g.,a top surface) of a processed wafer (such as a silicon wafer orsilicon-on-insulator (“SOI”) wafer) to configure a circuit of electroniccomponents of the wafer. Described examples facilitate trimming analogcircuits, and programming digital and analog circuits to set or modifycircuit configuration after wafer processing, before singulation andpackaging during microelectronic device manufacturing. The method 100includes fabricating a wafer at 102, and configuring circuitry ofelectronic components of the processed wafer at 103, before finalassembly and packaging. The wafer fabrication at 102 includes formingelectronic components on or in a semiconductor substrate, andmetallization processing to form a metallization structure over thesubstrate. The metallization processing includes forming one or moredielectric layers with conductive routing structures connected to one ormore of the electronic components to provide a processed wafer with atop surface that exposes two or more of the conductive routingstructures. The metallization structure's top surface is not required tobe planar. In some examples, the top surface exposes a conductiverouting structure of an upper-most metallization layer, and also exposesa conductive routing structure of a different (e.g., lower)metallization layer. The wafer fabrication at 102 includes forming apassivation layer over select portions of the first surface of thewafer. Where used, the passivation layer formation covers selectportions of the top surface and leaves portions of the conductiverouting structures exposed.

The example manufacturing method 100 includes a circuit configurationmethod 103. The processing at 103 includes configuring circuitry of theelectronic components of the processed wafer using additive deposition.The configuration processing at 103 includes performing a first waferprobe test at 104 that measures a parameter of the circuitry of theelectronic components. The processed wafer includes multiple die areasthat will ultimately be singulated into separate integrated circuit diesfor subsequent packaging to form microelectronic devices. In thisexample, each die area includes: (a) one or more electronic componentsformed on or in the die area's respective portion of the semiconductorsubstrate of the processed wafer; and (b) conductive routing structuresof the metallization structure to provide external access for electricalinterconnection by a probe machine. The first wafer probe testing at 104can include: (a) application of probe signals to one or more probedelectrical connections; and (b) measurement of one or more parametersassociated with circuitry of the electronic components of the processedwafer. The probe test at 104 identifies operability and performanceparameters of die areas and the associated circuitry thereof. The probetest can identify any malfunctioning circuits. If a die area'srespective circuits include features for self-repair (e.g., spare memorycells), then the die area can be identified for subsequent self-repairthrough additive deposition as described further below. For each diearea of the processed wafer, the first probe testing 104 collectsrespective trim or configuration data to identify locations forsubsequent additive deposition to set or modify a circuit configurationof the wafer.

At 106, the method 100 further includes depositing a material on the topsurface of the wafer from an exposed portion of the first conductiverouting structure to an exposed portion of the second conductive routingstructure to configure the circuitry of the electronic components. Thelocation and/or material used in the deposition at 106 is determined atleast partially according to (e.g., in response to or based upon) one ormore parameters measured during any wafer probe processing portion of104. In this manner, the measured circuit condition of the processedwafer is selectively adjusted or set according to the wafer proberesults. The additive deposition at 106 provides a controlled formationof one or more structures connected between two or more exposedconductive routing structures of the wafer metallization structure. Thedeposited structures operate as jumpers and/or resistors to modify orset a circuit configuration in the die. The additively depositedmaterial forms an ohmic contact to the exposed portion of the conductiverouting structure of the metallization layer or layers. The additivelydeposited material is tailored to create an ohmic contact with acontrolled metal-metal interface to the material of the conductiverouting structure (e.g., aluminum, copper, etc.) without creating aSchottky diode.

The deposition at 106 includes depositing a first conductive material toform a conductive jumper between the exposed portion of the firstconductive routing structure and the exposed portion of the secondconductive routing structure. The deposition at 106 includes depositinga resistive material to form a resistor or fuse between the exposedportion of the first conductive routing structure and the exposedportion of the second conductive routing structure. The deposition at106 includes depositing a semiconductor material to form a semiconductorstructure between the exposed portion of the first conductive routingstructure and the exposed portion of the second conductive routingstructure. The deposition at 105 includes performing a printing processor other additive deposition process to form the material. The printingprocess at 106 is an ink jet process. In another example, the printingprocess at 106 is an electrostatic jet process. In another example, theprinting process at 106 is a jet dispense process. In another example,the printing process at 106 is a laser assisted deposition process. Inanother example, the printing process at 106 is a spray process. Inanother example, the printing process at 106 is a screen printingprocess. Multiple printing processes are performed at 106.

In the example method 100 of FIG. 1, a cure process is performed at 108to cure the material deposited at 106. The processing at 108 includespre-baking the wafer and exposing the deposited material to ultraviolet(UV) light to facilitate drying and establishing a desired materialproperty of the first deposited material. In other implementations, theoptional cure processing at 108 can be omitted.

The example method 100 of FIG. 1 includes performing a second waferprobe test at 110 after the additive deposition processing at 106. Thesecond wafer probe test at 110 measures the circuit parameter orparameters that were tested in the first wafer probe at 104. Furtheradditive deposition can be performed along with any cure processingportion of 106 and 108, according to (e.g., in response to or basedupon) the results of the second wafer probe test at 110. In otherexamples, the second wafer probe processing at 110 can be omitted.

At 112, the example method 100 further includes applying a voltagesignal or a current signal to the deposited material to disconnect thefirst conductive routing structure from the second conductive routingstructure. The material printed at 106 creates an electrical fuse: (a)between two conductive routing structures; and (b) therefore, betweenelectrical components that are respectively connected to those twoconductive routing structures. The fuse material can be resistive tooperate as a jumper for resistive interconnection of the associatedelectrical components, or the fuse material can be opened (e.g., blown)at 112 by providing a voltage or current signal between the conductiverouting structures or between other externally accessible conductivefeatures of the wafer. In another example, the material printed at 106creates an electrical resistor: (a) between two conductive routingstructures; and (b) therefore, between electrical components that arerespectively connected to those two conductive routing structures. Allor a portion of the resistive material can be removed, such as by lasertrimming at 112, to adjust the circuitry of the electronic components.For example, a resistive material can be additively deposited with aninitial width at 106, and thereafter laser trimming can be used at 112to narrow the deposited resistive material, thereby increasing theresistance. This facilitates fine-tuning and trimming of circuitperformance parameters before or after IC packaging to correct for anychanges in performance introduced to the circuit by mechanical stressfrom the assembly and packaging of the IC. In the illustrated example,the desired fuse or fuses is/are blown at 112 before assembly andpackaging at 114. In other examples, the current or voltage signal isapplied following the assembly processing at 114. In yet anotherexample, the signal application process at 112 can be omitted. Theinitial wafer probe operations at 104 and/or the subsequent wafer probeprocessing at 110 include(s) an optical probe to identify topographicfeatures of the top surface 219 of the processed wafer 200, and theadditive deposition processing at 106 is adjusted to preferentiallydeposit material structures (e.g., conductive material, resistivematerial, semiconductor material, etc.) in the identified valleys orlow-lying areas of the top surface 219. Accordingly, some fabricationprocesses at 102 include planarizing the top surface 219, and otherwafer fabrication processing at 102 omits top surface planarizationprocessing, leaving high and low topographic features on the top surface219. In some implementations, the additive deposition at 106preferentially deposits material in low-lying regions between steps onthe top surface 219. In one implementation, the low-lying regions areidentified through optical wafer probing at 104 and/or 110. One exampleimplementation includes detecting characteristics of the surface at 110and modifying the additive process at 106 to adjust for differences inthe surface die to die for a specific region of the wafer that is goingto be modified.

Following the configuration processing at 103 (e.g., steps 104-112 inFIG. 1), the example manufacturing method 100 includes assemblyprocessing at 114. The assembly processing includes one or more of backgrinding the processed wafer, sawing or laser cutting the wafer tosingulate the wafer into separate dies that include respective circuitsformed by the electronic components, die attach processing to attacheach die to a respective lead frame, wire bonding to attach bond wiresto the die and lead frame features, cleaning processes, such as a plasmacleaning step (e.g., Ar/O₂), and molding operations to form a finishedmicroelectronic device (e.g., a microelectronic device having anintegrated circuit). At 116, final testing is performed to verifyoperation of the finished microelectronic device. The assemblyprocessing at 114 includes forming a passivation layer (e.g., 230 inFIG. 2) over the top surface, to cover all or at least a portion of theadditively deposited material formed at 106. Where the depositedmaterial includes silver, the formation of an additional passivationlayer over the additively deposited silver facilitates prevention ormitigation of silver migration. The subsequently formed passivationmaterial can be deposited using any suitable process, including additivedeposition (e.g., printing), chemical vapor deposition (CVD) to deposita nitride or oxynitride passivation material, etc.

FIG. 2 shows an example microelectronic device during manufacturingaccording to the example method 100. A processed wafer 200 is shown inFIG. 2, including an example die portion or die area 201. As describedabove, the wafer 200 is processed as a unitary structure, including theexample additive deposition processing (e.g., 106 in FIG. 1), andsubsequently singulated into separate dies 201. The device in FIG. 2includes a semiconductor substrate 202 (e.g., a silicon wafer, SOIwafer, etc.), and a number of electronic components are formed on or inthe substrate 202. In the illustrated example, polysilicon structures204 are formed over and upper surface of the substrate 202, andisolation structures 206 (e.g., field oxide structures, shallow trenchisolation (STI) structures, etc.) are formed to isolate selected regionsor areas of the substrate 202. One or more portions of the substrate 202and/or of the polysilicon structures 204 are selectively implanted withp-type or n-type impurities or dopants using conventional semiconductorprocessing techniques and apparatus to form one or more electroniccomponents. Some of the polysilicon structures 204 provide polysiliconresistors 208, and the illustrated example further includes a number offield effect transistors (e.g., MOSFETs) 210 formed on or in thesubstrate 202. FIG. 2 shows the example labels for some of thepolysilicon resistors, including resistors R1, R2, R3 and R4. Othertypes and forms of electronic components can be formed on or in thesubstrate and/or subsequently-formed metallization structures, such asinductors, capacitors, etc.

A first metallization layer 212 is formed over the upper surface of thesubstrate 202, the polysilicon structures 204 and the isolationstructures 206. The first metallization layer or level 212 is referredto as a pre-metallization dielectric (PMD) layer, and can be anysuitable dielectric material, such as silicon dioxide (SiO₂). Conductivecontacts 214 are formed of suitable conductive material (e.g., tungsten(W), copper (Cu), etc.) through the PMD layer 212 to form ohmicconductive contacts to select portions of the electronic components 208,210. One or more additional metallization layers, referred to asinter-layer dielectric (ILD) layers, are formed over the PMD layer 212to provide a single or multi-layer structure 216. The metallizationstructure 212, 216 includes a final or uppermost ILD dielectric layer218 with a top or upper surface 219. The ILD layers 216 includeconductive routing structures to form interconnections throughassociated PMD layer contacts 214 to interconnect various electroniccomponents of the wafer 200 to one another, and to provide externalconnectivity to various ones of the electronic component features.Conductive routing structures 220 (e.g., copper) have upper surfacesexposed through the top or upper surface 219 of the final ILD layer 218.The illustrated example includes a passivation layer 222 (e.g., oxide,oxynitride, polyamide, nitride material, etc.) formed over selectportions of the top ILD layer 218. The passivation layer 222 exposesportions of the tops of the illustrated conductive routing structures220.

In the example of FIG. 2, the metallization structure 212, 216 includesfirst and second conductive routing structures 220 electricallyconnected to a particular ones of the resistors 208, including: (a) afirst (left-most) conductive routing structure 220 connected to a nodethat joins the resistors R2 and R4; and (b) a second conductive routingstructure 220 connected to a first end of the resistor R3. Conductive orresistive or semiconductive connection of the first and secondconductive routing structures 220 to one another by additive depositionof a material 224 electrically connects the first end of the resistor R3to the node that joins the resistors R2 and R4. In the example of FIG.2, the processing at 106 is used to form a conductive material 224between the conductive routing structures 220 to provide an ohmiccontact between the first end of the resistor R3 and the node that joinsR2 and R4. Examples of suitable deposited conductive materials 224include nanoparticle materials, sol-gel, metal-salt decomposition or thelike. This electrically connects R3 in parallel with the seriescombination of R1 and R2, and thus changes the circuit configuration ofthe resistor components 208. The illustrated example also includesconductive routing structures 220 electrically connected to the gates ofthe example transistors 210. Also, specific conductive routingstructures 220 are connected to a reference voltage node (e.g., labeledGND in FIG. 2), and to a supply voltage node (e.g., labeled VCC in FIG.2). Although the example of FIG. 2 illustrates formation of structures224 between exposed portions of that are in an upper-most metallizationlayer 218, the additive deposition processing at 106 is useful in otherexamples to form structures (e.g., conductive structures 224) thatconnect to conductive routing structures in different layers of amulti-layer metallization structure 216, such as where the top or firstsurface 219 of the metallization structure 212, 216 includes openingsthat expose portions of such conductive routing structures of variousmetallization layers.

The processing at 106 creates a conductive material 224 that connectsthe gate of one of the transistor components 210 to the ground referenceGND, and forms a second structure 224 that connects the gate of theother transistor 210 to the supply voltage VCC. In this manner, theselective additive deposition of the material structures 224 over thetop surface 219 of the metallization structure 212, 216 sets or adjuststhe circuit configuration of the electronic components in theillustrated die area 201 of the wafer 200. FIG. 2 also illustrates theuse of a spray or printing process with a print head or spray nozzle 226during the creation of one of the conductive material structures 224. Inthis example, the deposition system translates the print head or spraynozzle 226 from left to right along the direction 228 in FIG. 2, inorder to deposit the material 224 extending between the selectedconductive routing structures 220. FIG. 2 further illustrates an examplesecond passivation structure 230 formed over one of the additivelydeposited conductive material structures 224.

FIG. 3 shows a partial top view of the wafer 200 taken along line 3-3 ofFIG. 2, including upper portions of the conductive routing structures220 exposed through the passivation layer 222. FIG. 3 also shows thedeposited conductive material structures 224 joining selected pairs ofthe conductive routing structures 220. Also, FIG. 3 schematically showscircuit connections provided by the conductive structures 224 toconfigure an analog circuit 300 and a digital circuit 310.

The analog (e.g., resistive) circuit 300 in FIG. 3 is formed by theseries connection of resistor components 208, labeled R1, R2, R4, R5 andR6 in the schematic illustration of FIG. 3. The resistors R1 and R2 areconnected between the circuit nodes 302 and 304, and the resistors R4-R6are connected in series with one another between the node 304 and afurther node 306. The bottom terminals or legs of the resistors R1 andR3 are connected to one another in the metallization structure 216 inFIG. 2 to form the illustrated circuit node 302. The additive depositionof the structure 224 between a first conductive routing structure 220(connected to the upper terminal of R3) and a second conductive routingstructure 220 (connected to the node that joins R2 and R4) connects theresistor R3 in parallel with the series combination of R1 and R2. Thissets or modifies the resistance in the circuit between the nodes 302 and306. Conversely, the omission of this additivity deposited structure 224provides a different resistance between the nodes 302 and 306.

The digital circuit 310 in FIG. 3 includes two or more inverters 312,which include the transistor components 210. The inverters 312 includeoutputs that provide Boolean signals (e.g., having a first state or adifferent second state), which can be used to program or configure alarger digital circuit and/or an analog circuit. The input to the firstinverter 312 is connected to a first conductive routing structure 220,and the example deposited material structure 224 provides an ohmicelectrical connection of the inverter input to conductive routingstructure 220 connected to the reference voltage node (GND). Aftermanufacturing, the microelectronic device formed using the example ofdie will be programmed by a high signal at the output of the inverter312 as a result of the additive deposition of the conductive materialstructure 224 during manufacturing. The second illustrated inverter 314includes an input (e.g., the gate of one of the transistor components210 in FIG. 2) electrically connected through the metallizationstructure 212, 216 to a respective conductive routing structure 220. Theadditivity deposited conductive material structure 224 in FIG. 3provides an ohmic electrical contact between the input of the inverter314 and the supply voltage conductive routing structure 220. Inoperation of the resulting microelectronic device, the output of theinverter 314 will provide a low electrical signal.

FIG. 4 shows another example of the processed wafer 200, generally asdescribed above in connection with FIG. 2. In this example, the additivedeposition processing at 106 in FIG. 1 forms conductive materialstructures 224 to configure the digital circuit 310 as described abovein connection with FIGS. 2 and 3. In this example, the additivedeposition processing at 106 in the method 100 of FIG. 1 deposits aresistive material 400 that extends from a first conductive routingstructure 220 (connected to the node 304 in FIG. 3) to the secondconductive routing structure 220 (connected to the node 302). Examplesof suitable resistor materials 400 include carbon-based materials andall allotropes thereof, polymer filled with carbon/conductive particles,solution deposited metals, etc. This creates a new resistor R7 in serieswith R3, and this series combination is connected in parallel with theseries combination of R1 and R2 (between the nodes 302 and 304 in FIG.3). This example provides a different resistance between the nodes 302and 304 than the additive printing of a conductive material structure224 as shown in FIGS. 2 and 3. Accordingly, the processing at 106 inFIG. 1 can include performance of multiple additive depositionprocesses, such as: (a) a first additive deposition of a conductivematerial 224 to configure the digital circuit 310; and (b) a secondadditive deposition of a resistive material 400 to configure the analogcircuit 300.

FIG. 5 shows yet another example of the processed wafer 200, generallyas described above in connection with FIG. 2. In this further example,the additive deposition processing at 106 forms the conductive materialstructures 224 to configure the digital circuit 310, and also deposits asemiconductive material 500 that extends from the first conductiverouting structure 220 (connected to the node 304 in FIG. 3) to thesecond conductive routing structure 220 (connected to the node 302).Examples of suitable semi conductive materials 500 include silicon andsolids or liquid solutions that include silicon. This example creates asemiconductor structure between the upper terminal of the resistor R3and the node 304 in the analog circuit 300 of FIG. 3. Two differentsemiconductor depositions are performed to create the illustratedstructure 500 to create a diode between the first and second conductiverouting structures 220 in the analog circuit 300.

FIG. 6 shows a top view of several die areas 201 of the processed wafer200 after the wafer fabrication at 102 and before the additivedeposition processing at 106 in FIG. 1. At this stage of themanufacturing process, the tops of the conductive routing structures 220are exposed through openings in any passivation layer at the top surface219 of the upper-most metallization structure dielectric layer 218,generally as described above in connection with FIG. 2. In this example,the additive deposition processing at 106 in FIG. 1 forms conductivematerial structures 224 to configure the digital circuit 310 asdescribed above in connection with FIGS. 2 and 3. In this example, theadditive deposition processing at 106 in the method 100 of FIG. 1deposits a resistive material 400 that extends from a first conductiverouting structure 220 (connected to the node 304 in FIG. 3) to thesecond conductive routing structure 220 (connected to the node 302).This creates a new resistor R7 in series with R3, and this seriescombination is connected in parallel with the series combination of R1and R2 (between the nodes 302 and 304 in FIG. 3). This example providesa different resistance between the nodes 302 and 304 than the additiveprinting of a conductive material structure 224 as shown in FIGS. 2 and3. Accordingly, the processing at 106 in FIG. 1 can include performanceof multiple additive deposition processes, such as: (a) a first additivedeposition of a conductive material 224 to configure the digital circuit310; and (b) a second additive deposition of a resistive material 400 toconfigure the analog circuit 300.

Based on wafer probe testing at 104, or a predetermined fabricationprocess, the additive deposition processing is performed at 106 in FIG.1 to provide the wafer structure 200 illustrated in FIG. 7. In thisexample, various different material structures 224, 400 and 500 havebeen additively deposited over the metallization structure to provideconductive, resistive and/or semiconductive interconnections betweenvarious pairs of the exposed conductive routing structures 220.Moreover, as shown in this example, some of the digital circuits areprogrammed differently for different die areas 201. This exampleillustrates the flexibility of the described process 100 to allow somedies to be configured one way, and other dies to be configureddifferently with respect to programming of the digital circuits 310.This example also shows that the analog circuits 300 of different dies201 can be configured differently on a single wafer 200. FIG. 8 shows anexample singulated die 201 of the wafer 200 of FIGS. 6 and 7.

Described examples provide significant advantages over other analog anddigital circuit trimming or programming techniques. For example, thedescribed examples do not require significant die space, especiallycompared with EEPROM, OTP and/or poly fuse approaches. Also, thedescribed methods do not require complex interconnection of circuitcomponents or associated additional metallization structure layerscompared with other circuit trimming or programming techniques. Thedescribed examples are useful for any suitable trimming or programmingtasks during manufacturing of an integrated circuit or microelectronicdevices, such as configuration of temperature measurement circuits,reference voltage circuits, current measurement circuits, timing (e.g.,clock) reference circuits or the like. Moreover, the described examplesare useful to create different products from a single IC design byconfiguring specific functions, such as output stage topologies orspecifications (e.g., regulated output voltage or detection thresholds).Examples use printed metals, conductive polymers or other electricallyconductive/semiconductive/resistive material 224, 400, 500 to createjumpers to replace traditional nonvolatile memories for trimming orother configuration of circuits at the wafer level. The describedexamples also provide flexibility to allow unique configuration of eachdie on a wafer, based upon probe level measurements and/or according toa predetermined production plan. The described examples further provideenhanced circuit reliability through the use of additive deposition.Compared with polysilicon fuse techniques, in which a polysiliconstructure is fabricated during wafer processing and thereafter subjectedto high currents or laser cutting to “blow” or open circuit the fuse,the described examples do not suffer from the possibility of re-growinga fuse or laser link. The described examples also provide wide tolerancefor variation of resistance/impedance of a particular connection. Also,the described examples provide flexibility for a variety of differenttrimming and/or programming functions at very low cost, withoutadditional masking layers to create new components. Exampleimplementations also facilitate expedited manufacturing, where variousspray or printing additive deposition implementations can print a 300 mmwafer 200 in less than five minutes with a unique pattern for each die201.

Modifications are possible in the described embodiments, and otherembodiments are possible, within the scope of the claims.

What is claimed is:
 1. A method of manufacturing an integrated circuit,the method comprising: fabricating a wafer, including a first surfacethat exposes portions of first and second conductive routing structures,wherein the first conductive routing structure is electrically connectedto a first electronic component, and the second conductive routingstructure is electrically connected to a second electronic component;depositing a material on the first surface of the wafer, from theexposed portion of the first conductive routing structure to the exposedportion of the second conductive routing structure, to configurecircuitry that includes the first and second electronic components; andsingulating the wafer into separate dies, including a die that includesthe circuitry.
 2. The method of claim 1, further comprising: beforedepositing the material, forming a passivation layer over selectportions of the first surface of the wafer.
 3. The method of claim 1,further comprising: before depositing the material, performing a waferprobe test that measures a parameter of the circuitry, whereindepositing the material includes depositing the material to configurethe circuitry according to the parameter.
 4. The method of claim 3,wherein the wafer probe test is a first wafer probe test, and the methodfurther comprises: after depositing the material, performing a secondwafer probe test that measures the parameter.
 5. The method of claim 1,wherein depositing the material includes performing a printing processto deposit a conductive material to form a conductive jumper between theexposed portion of the first conductive routing structure and theexposed portion of the second conductive routing structure.
 6. Themethod of claim 5, wherein the printing process is selected from thegroup consisting of an ink jet process, an electrostatic jet process, ajet dispense process, a laser assisted deposition process, a sprayprocess, and a screen printing process.
 7. The method of claim 1,wherein depositing the material includes performing a printing processto deposit a resistive material to form a resistor or fuse between theexposed portion of the first conductive routing structure and theexposed portion of the second conductive routing structure.
 8. Themethod of claim 7, wherein the printing process is selected from thegroup consisting of an ink jet process, an electrostatic jet process, ajet dispense process, a laser assisted deposition process, a sprayprocess, and a screen printing process.
 9. The method of claim 7,further comprising at least one of: after depositing the material,applying a voltage signal or a current signal to the deposited materialto disconnect the first conductive routing structure from the secondconductive routing structure; and after depositing the material,removing a portion of the deposited material to adjust the circuitry.10. The method of claim 1, wherein depositing the material includesperforming a printing process to deposit a semiconductor material toform a semiconductor structure between the exposed portion of the firstconductive routing structure and the exposed portion of the secondconductive routing structure.
 11. The method of claim 10, wherein theprinting process is selected from the group consisting of an ink jetprocess, an electrostatic jet process, a jet dispense process, a laserassisted deposition process, a spray process, and a screen printingprocess.
 12. The method of claim 1, wherein fabricating the waferincludes: forming the first and second electronic components on or in asemiconductor substrate; and forming a metallization structure thatexposes the portions of the first and second conductive routingstructures, the metallization structure being formed over the substrateand including a dielectric layer.
 13. The method of claim 1, furthercomprising: after depositing the material, forming a passivation layerover at least a portion of the material.
 14. The method of claim 1,further comprising: detecting characteristics of the first surface; andmodifying deposition of the material on the first surface to adjust fordifferences in the surface die to die for a specific region of thewafer.
 15. A method of configuring circuitry of an integrated circuit,the method comprising: providing a processed wafer including: asemiconductor substrate with electronic components; and a metallizationstructure including a dielectric layer; and performing an additivedeposition process that deposits a material over the dielectric layer toform a conductive or resistive structure that extends from an exposedportion of a first conductive routing structure to an exposed portion ofa second conductive routing structure to configure the circuitry,wherein the first conductive routing structure is electrically connectedto a first one of the electronic components, the second conductiverouting structure is electrically connected to a second one of theelectronic components, and the circuitry includes the first and secondelectronic components.
 16. The method of claim 15, further comprising:before performing the additive deposition process, performing a waferprobe test that measures a parameter of the circuitry, whereinperforming the additive deposition process includes performing theadditive deposition process to configure the circuitry according to theparameter.
 17. The method of claim 16, wherein the wafer probe test is afirst wafer probe test, and the method further comprises: afterperforming the additive deposition process, performing a second waferprobe test that measures the parameter.
 18. The method of claim 17,further comprising at least one of: after performing the second waferprobe test, applying a voltage signal or a current signal to thedeposited material to disconnect the first conductive routing structurefrom the second conductive routing structure; and after depositing thematerial, removing a portion of the deposited material to adjust thecircuitry.
 18. The method of claim 15, wherein the additive depositionprocess is selected from the group consisting of an ink jet process, anelectrostatic jet process, a jet dispense process, a laser assisteddeposition process, a spray process, and a screen printing process. 20.The method of claim 15, further comprising at least one of: afterdepositing the material, applying a voltage signal or a current signalto the deposited material to disconnect the first conductive routingstructure from the second conductive routing structure; and afterdepositing the material, removing a portion of the deposited material toadjust the circuitry.
 21. The method of claim 15, wherein the additivedeposition process deposits a semiconductor material to form asemiconductor structure between the exposed portion of the firstconductive routing structure and the exposed portion of the secondconductive routing structure.
 22. An integrated circuit, comprising: asemiconductor substrate; electronic components on or in thesemiconductor substrate; a metallization structure, including: a firstconductive routing structure electrically connected to a first one ofthe electronic components; a second conductive routing structure that iselectrically connected to a second one of the electronic components; anda dielectric layer; and an additively deposited material disposed overthe dielectric layer, the material extending from a portion of the firstconductive routing structure to a portion of the second conductiverouting structure.
 23. The integrated circuit of claim 22, wherein theadditively deposited material is a conductive jumper.
 24. The integratedcircuit of claim 22, wherein the additively deposited material is aresistor or fuse.
 25. The integrated circuit of claim 22, wherein theadditively deposited material is a semiconductor structure.
 26. Theintegrated circuit of claim 22, wherein the additively depositedmaterial is a passivation layer.